Advances in materials characterization (L., 2007). - ОГЛАВЛЕНИЕ / CONTENTS
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ОбложкаAdvances in materials characterization / ed. by Amarendra G., Baldev R., Manghnani M.H. - L.: Taylor S Francis, 2007. - 220 p. - (Series in metallurgy and materials science). - ISBN 1-4200-4729-9
 

Оглавление / Contents
 
Introduction. Introduction to Materials Characterization ........ 1
                 G. Amarendra, Baldev Raj and M.H. Manghnani

Chapter 1.    Atomistic Characterization of Materials using
              Scanning Tunneling Microscopy/Spectroscopy ....... 23
                 С.V. Dharmadhikari

Chapter 2.    Recent Advances in Characterization of
              Materials using Electron Microscopy .............. 45
                 M. Vijayalakshmi

Chapter 3.    X-ray Reflectivity: A Non-destructive Technique
              for the Study of Thin Films and Multilayers ...... 63
                 Ajay Gupta

Chapter 4.    Latest Trends in Ultrasonic Technique for
              Materials Characterization ....................... 88
                 С.Н. Chen, T. Jayakumar and Anish Kumar

Chapter 5.    Characterization of Soft Condensed Matter using
              Confocal Microscopy ............................. 123
                 B.V.R. Tata and Baldev Raj

Chapter 6.    Characterization of Defects in Semiconductor
              Devices using Positron Annihilation ............. 157
                 R. Suzuki and G. Amarendra

Chapter 7.    Elasticity Characterization of Covalent
              (B-C-N)Hard Materials and Films by
              Brillouin Scattering ............................ 184
                 Pavel V. Zinin and Murli H. Manghnani

Contributors and editors ...................................... 212
Index ......................................................... 213



 
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