Section One. Technical Overview
Preface ........................................................ XV
Moon Gi Kang
Introduction .................................................... 1
Solid-state image sensor: technologies and applications ......... 3
Yawcheng Lo (in Input/Output and Imaging Technologies, Yusheng
Tim Tsai, Teh-Ming Kung, Jan Larsen, editors, 1998)
The invention of the CCD ....................................... 14
George E. Smith (Nuclear Instruments and Methods in Physics
Research A 2001)
Bucket-brigade electronics—new possibilities for delay,
time-axis conversion, and scanning ............................. 19
F.L.J. Sangster, K. Teer (IEEE Journal of Solid-State
Circuits 1969)
Free charge transfer in charge-coupled devices ................. 25
James E. Cames, Walter F. Kosonocky, Edward G. Ramberg
(IEEE Transactions on Electron Devices 1972)
Charge-injection imaging: operating techniques and
performances characteristics ................................... 36
Hubert K. Burke, Gerald J. Michon (IEEE Journal of
Solid-State Circuits 1976)
High speed multiplexed pipelined optoelectronic devices: CCDs
and EBCCDs ..................................................... 44
M. Gruwé (Nuclear Instruments and Methods in Physics
Research A 1997)
MOS area sensor: Part I—design consideration and performance
of an n-p-n structure 484 × 384 element color MOS imager ....... 48
Norio Koike, Iwao Takemoto, Kazuhiro Satoh, Shoji Hanamura,
Shusaku Nagahara, Masaharu Kubo (IEEE Journal of Solid-
State Circuits 1980)
A random access photodiode array for intelligent image
capture ........................................................ 54
Orly Yadid-Pecht, Ran Ginosar, Yosi Shacham Diamand
(IEEE Transactions on Electron Devices 1991)
CMOS image sensors: electronic camera-on-a-chip ................ 63
Eric R. Fossum (IEEE Transactions on Electron Devices 1997)
CMOS active pixel image sensors ................................ 73
Eric R. Fossum (Nuclear Instruments and Methods in Physics
Research A 1997)
CMOS sensor systems ............................................ 80
Bedrich J. Hosticka (Sensors and Actuators A 1998)
Avalanche photodiode image sensor in standard silicon BiCMOS
technology ..................................................... 87
Alice Biber, Peter Seitz, Heinz Jäckel (Sensors and
Actuators A 2001)
Section Two. Physical Limitations and Efforts to Overcome Them
Introduction ................................................... 95
Section 2.1 Sensor Noise bsues
Noise sources in charge-coupled devices ....................... 101
J.E. Cames, W.F. Kosonocky (RCA Review 1972)
The quantitative effects of interface states on the
performance of charge-coupled devices ......................... 110
Michael F. Tompsett (IEEE Transactions on Electron Devices
1973)
Noise reduction techniques for CCD image sensors .............. 121
G.R. Hopkinson, D.H. Lumb (Journal of Physics E:
Scientific Instruments 1982)
Dynamic suppression of interface-state dark current in
buried-channel CCD's .......................................... 130
Barry E. Burke, Stephanie A. Gajar (IEEE Transactions on
Electron Devices 1991)
CCD on-chip amplifiers: noise performance versus MOS
transistor dimensions ......................................... 136
Peter Centen (IEEE Transactions on Electron Devices 1991)
Compensation for readout noise in CCD images .................. 147
Donald L. Snyder, Carl W. Helstrom, Aaron D. Lanterman,
Mohammad Faisal, Richard L. White (Journal of the Optical
Society of America A 1995)
Photon-noise-limited operation of intensified CCD cameras ..... 159
A. Frenkel, M.A. Sartor, M.S. Wlodawski (Applied Optics
1997)
Sub-Poisson statistics observed in an electronically
shuttered and back-illuminated CCD pixel ...................... 169
Robert K. Reich (IEEE Transactions on Electron Devices
1997)
Offset-free black restoration and simplified correlated
double sampling for linear CCDs ............................... 174
M.G. Plichta, G.W. Milne (Electronics Letters 1997)
Noise analysis of a fully integrated CMOS image sensor ........ 176
Kalwant Singh (in Conference on Sensors, Cameras, and
Applications for Digital Photography, Nitin Sampat,
Thomas Yeh, editors, 1999)
Characterisation of the signal and noise transfer of CCD
cameras for electron detection ................................ 184
Rüdiger R. Meyer, Angus I. Kirkland (Microscopy Research
and Technique 2000)
Design of an APS CMOS image sensor for low light level
applications using standard CMOS technology ................... 196
J. Goy, B. Courtois, J.M. Karam, F. Pressecq (Analog
Integrated Circuits and Signal Processing 2001)
Section 2.2 Sensitivity and Limited Dynamic Range Issues
An automatic light spectrum compensation method for
CCD white balance measurement ................................. 209
Dahong Qian, James Toker, Selim Bencuya (IEEE Transactions
on Consumer Electronics 1997)
A fast calculation algorithm for the charge transfer loss
in CCDs ....................................................... 214
N. Krause, U.G. Briel, M. Popp, H. Soltau, T. Stadlbauer,
L. Strüder (Nuclear Instruments and Methods in Physics
Research A 2000)
Sensitivity improvement in progressive-scan FT-CCDs for
digital still camera applications ............................. 221
Harry C. van Kuijk, Jan T. Bosiers, Agnes C. Kleimann,
Laurent Le Cam, Joris P. Maas, Herman L. Peek, Christian
R. Peschel (International Electron Devices Meeting (IEDM)
Technical Digest 2000)
Optical characterization methods for solid-state image
sensors ....................................................... 225
M. Willemin, N. Blanc, G.K. Lang, S. Lauxtermann,
P. Schwider, P. Seitz, M. Wäny (Optics and Lasers in
Engineering 2001)
High dynamic range imaging: spatially varying pixel exposures . 235
Shree K. Nayar, Tomoo Mitsunaga (Proc. IEEE Conference
on Computer Vision and Pattern Recognition 2000)
High sensitivity high dynamic, digital CMOS imager ............ 243
M. Waeny, S. Tanner, S. Lauxtermann, N. Blanc,
M. Willemin, M. Rechsteiner, E. Doering, J. Grupp,
P. Seitz, F. Pellandini, M. Ansorge (in Sensors and
Camera Systems for Scientific, Industrial, and Digital
Photography Applications II, Morley M. Blouke,
John Canosa, Nitin Sampat, editors, 2001)
A high-sensitivity CCD image sensor using source follower
circuit with actively controlled gain characteristics ......... 250
Sangsik Park, Hyungsoo Uh, Seokrim Choi (Sensors and
Actuators A 2002)
Section 2.3 Spatial Resolution Issues
A new device architecture suitable for high-resolution and
high-performance image sensors ................................ 257
Jaroslav Hynecek (IEEE Transactions on Electron Devices
1988)
A 1920(H) X 1035(V) pixel high-definition CCD image sensor .... 264
Eiji Oda, Kenji Nagano, Takanori Tanaka, Nobuhiko Mutoh,
Kozo Orihara (IEEE Journal of Solid-State Circuits 1989)
A 1/3-in 270 000 pixel CCD image sensor ....................... 271
Toshihiro Kuriyama, Hirotatsu Kodama, Toshiyuki Kozono,
Yasushi Kitahama, Yoshikimi Morita, Yoshimitsu Hiroshima
(IEEE Transactions on Electron Devices 1991)
A 2-million-pixel CCD image sensor overlaid with an
amorphous silicon photoconversion layer ....................... 276
Sohei Manabe, Yosiyuki Mastunaga, Akihiko Furukawa,
Kensaku Yano, Yukio Endo, Ryohei Miyagawa, Yosinori
Iida, Yositaka Egawa, Hidenori Shibata, Hidetosi
Nozaki, Naoshi Sakuma, Nozomu Harada (IEEE Transactions
on Electron Devices 1991)
Multiresolution image sensor .................................. 283
Sabrina E. Kemeny, Roger Panicacci, Bedabrata Pain,
Larry Matthies, Eric R. Fossum (IEEE Transactions on
Circuits and Systems for Video Technology 1997)
Characterization of CMOS image sensors with Nyquist rate
pixel level ADC ............................................... 292
David Yang, Hui Tian, Boyd Fowler, Xinqiao Liu, Abbas
El Gamal (in Sensors, Cameras, and Applications for
Digital Photography, Nitin Sampat, Thomas Yeh, editors,
1999)
Novel subpixel imaging system with linear CCD sensors ......... 303
Desheng Wen, Xinping Liu, Wei Qiao, Hu Wang, Nianmao Deng
(in Sensors and Controls for Intelligent Manufacturing
II, Peter E. Orban, editor, 2001)
Section 2.4 Artifact Issues (Malfunctioning, Smearing,
and Blooming)
A method for processing CCD images to remove cosmic rays
and other randomly positioned spurious events - theory and
experiment .................................................... 313
L. Kay, D.A. Sadler (Measurement Science and Technology
1991)
Photoresponse nonlinearity of solid-state image sensors
with antiblooming protection .................................. 317
Eric G. Stevens (IEEE Transactions on Electron Devices
1991)
A 1-megapixel, progressive-scan image sensor with
antiblooming control and lag-free operation ................... 321
Eric G. Stevens, Bruce C. Burkey, David N. Nichols,
Ying S. Yee, David L. Losee, Teh-Hsuang Lee, Timothy
J. Tredwell, Rajindar P. Khosla (IEEE Transactions on
Electron Devices 1991)
Novel deblurring algorithms for images captured with CCD
cameras ....................................................... 329
Chen-Hsien Wu, John M.M. Anderson (Journal of the Optical
Society of America A 1997)
Smear correction for frame transfer charge-coupled-device
cameras ....................................................... 339
Wim Ruyten (Optics Letters 1999)
Restoration and frequency analysis of smeared CCD images ...... 342
Keith Powell, Deeph Chana, David Fish, Chris Thompson
(Applied Optics 1999)
Section 2.5 Color Reconstruction for the Single CCD Imager
Color imaging system using a single CCD area array ............ 349
Peter L.P. Dillon, David M. Lewis, Frank G. Kaspar
(IEEE Transactions on Electron Devices 1978)
Color reproduction of a single chip color camera with
a frame transfer CCD .......................................... 355
Kiyotsugu Ishikawa, Susumu Hashimoto, Yoshiaki Sone,
Takao Kunii (IEEE Journal of Solid-State Circuits 1981)
2/3-inch format MOS single-chip color imager .................. 358
Masakazu Aoki, Haruhisa Ando, Shinya Ohba, Iwao Takemoto,
Shusaku Nagahara, Toshio Nakano, Masaharu Kubo, Tsutomu
Fujita (IEEE Transactions on Electron Devices 1982)
Color filter arrays based on mutually exclusive blue noise
patterns ...................................................... 364
Wei Zhu, Kevin Parker, Michael A. Kriss (Journal of
Visual Communication and Image Representation 1999)
Edge-adaptive color interpolation algorithm for progressive
scan charge-coupled devi image sensors ........................ 387
Bong Soo Hur, Moon Gi Kang (Optical Engineering 2001)
Section Three. Applications
Introduction .................................................. 399
Section 3.1 Astronomical Imaging
CMOS active pixel sensor star tracker with regional
electronic shutter ............................................ 403
Orly Yadid-Pecht, Bedabrata Pain, Craig Staller,
Christopher Clark, Eric Fossum (IEEE journal of Solid-
State Circuits 1997)
Developments in X-ray and astronomical CCD imagers ............ 407
J.A. Gregory, B.E. Burke, B.B. Kosicki, R.K. Reich
(Nuclear Instruments and Methods in Physics Research
A 1999)
Developments in MOS CCDs for X-ray astronomy .................. 415
P.J. Pool, R. Holtom, D.J. Burt, A.D. Holland (Nuclear
Instruments and Methods in Physics Research A 1999)
Recent progress on CCDs for astronomical imaging .............. 422
D.E. Groom (in Optical and IR Telescope Instrumentation
and Detectors, Masanori lye, Alan F. Moorwood, editors,
2000)
Back-illuminated, fully-depleted CCD image sensors for use
in optical and near-IR astronomy .............................. 434
D.E. Groom, S.E. Holland, M.E. Levi, N.P. Palaio,
S. Perlmutter, R.J. Stover, M. Wei (Nuclear Instruments
and Methods in Physics Research A 2000)
CCD detectors for the advanced camera for surveys ............. 441
Marco Sirianni, Mark Clampin, George F. Hartig, Holland
C. Ford, David A. Golimowski, Garth Illingworth,
Pam Sullivan, Morley Blouke, Michael Lesser, Bill
Burmester, Ron Schrein, Randy Kimble (in Optical and
IR Telescope Instrumentation and Detectors, Masanori
lye, Alan F. Moorwood, editors, 2000)
Whole-sky patrol with 7k × 4k-CCD chips ....................... 447
P. Kroll, F. Fleischmann (Astronomische Nachrichten 2001)
Section 3.2 Medical Imaging
MTF evaluation of a phosphor-coated CCD for x-ray imaging ..... 451
M. Gambaccini, A. Taibi, A. Del Guerra, M. Marziani,
A. Tuffanelli (Physics in Medicine and Biology 1996)
A CMOS APS for dental X-ray imaging using scintillating
sensors ....................................................... 459
M.A. Abdalla, C. Fröjdh, C.S. Petersson (Nuclear
Instruments and Methods in Physics Research A 2001)
A CCD-based optical CT scanner for high-resolution 3D
imaging of radiation dose distributions: equipment
specifications, optical simulations and preliminary results ... 466
Simon J. Doran, Koen Klein Koerkamp, Mamdouh A. Bero,
Paul Jenneson, Edward J. Morton, Walter B. Gilboy
(Physics in Medicine and Biology 2001)
A comparison of the imaging properties of CCD-based devices
used for small field digital mammography ...................... 489
D.S. Evans, A. Workman, M. Payne (Physics in Medicine and
Biology 2002)
Evaluation of intraoral CCD camera for dental examination in
forensic inspection ........................................... 508
Tamiyuki Tsuzuki, Asao Ueno, Masahiro Kajiwara, Yoichi
Hanaoka, Hideki Uchiyama, Yukihisa Agawa, Tetsuya Takagi,
Yoshinobu Sato (Legal Medicine 2002)
Section 3.3 Consumer Electronics: Digital Cameras and Camcorders
A new CCD architecture of high-resolution and sensitivity
for color digital still picture ............................... 517
Masatoshi Tabei, Kiyotaka Kobayashi, Makoto Shizukuishi
(IEEE Transactions on Electron Devices 1991)
A 2/3-in 1187 (H) × 581 (V) S-VHS-compatible frame-transfer
CCD for ESP and movie mode .................................... 524
Jan T. Bosiers, Agnes C. Kleimann, Bart G. Dillen,
Herman L. Peek, Andre L. Kokshoorn, Noortje J. Daemen,
Arjen G. van der Sijde, Lieve T. van Gaal (IEEE
Transactions on Electron Devices 1991)
High-definition still image processing system using a new
structure CCD sensor .......................................... 534
Hiroshi Tamayama, Osamu Saito, Masafumi Inuiya (in
Sensors and Camera Systems fi Scientific, Industrial, and
Digital Photography Applications, Morley M. Blouke,
Nitin Sampat, George M. Williams, Jr., Thomas Yeh,
editors, 2000)
Low-power digital image sensor for still picture image
acquisition ................................................... 540
Steve Tanner, Stefan Lauxtermann, Martin Waeny, Michel
Willemin, Nicolas Blan Joachim Grupp, Rudolf Dinger, Elko
Doering, Michael Ansorge, Peter Seitz, Fausto
Pellandini (in Sensors and Camera Systems for Scientific,
Industrial, and Digital Photography Applications II,
Morley M. Blouke, John Canosa, Nitin Sampat, editors,
2001)
Frame transfer CCDs for digital still cameras: concept,
design, and evaluation ........................................ 548
Jan T. Bosiers, Agnes C. Kleimann, Harry C. van Kuijk,
Laurent Le Cam, Herman L. Peek, Joris P. Maas, Albert
J.P. Theuwissen (IEEE Transactions on Electron Devices
2002)
Section 3.4 Consumer Electronics: HDTV Cameras
HDTV single-chip CCD color camera ............................. 561
Takanori Tanaka, Satoshi Katoh, Ikuo Akiyama, Nobukazu
Teranishi, Kozo Orihara Eiji Oda (IEEE Transactions on
Consumer Electronics 1990)
The dual green pickup experiment for a compact HDTV color
camera with three-2/3 inch CCDs ............................... 568
Fumio Okano, Yoshihiro Fujita, Kohji Mitani, Kazuhiro
Kawashiri, Tetsuo Toma (IEEE Transactions on Broadcasting
1991)
A 1" format 1.5M pixel IT-CCD image sensor for an HDTV
camera system ................................................. 574
Kiyohiko Sakakibara, Hidekazu Yamamoto, Shigeto Maegawa,
Horoshi Kawashima,] Yasutaka Nishioka, Masao Yamawaki,
Sotoju Asai, Natsuro Tsubouchi, Tomohide Okumura, Junichi
Fujino (IEEE Transactions on Consumer Electronics 1991)
Section 3.5 Particle Detection and X-Ray Imaging
X-UV imaging with backside illuminated CCDs in laser-matter
interaction experiments ....................................... 583
A. Mens, R. Benattar, J.L. Bocher, J.M. Koenig, J.P. Le
Breton, D. Mazataud, P. Salières, D. Schumann (Journal
of Optics (Paris) 1993)
X-ray CCD response functions, front to back ................... 589
M.W. Bautz, G.Y. Prigozhin, M.J. Pivovaroff, S.E. Jones,
S.E. Kissel, G.R. Ricker (Nuclear Instruments and Methods
in Physics Research A 1999)
Charge diffusion in CCD X-ray detectors ....................... 602
George G. Pavlov, John A. Nousek (Nuclear Instruments
and Methods in Physics Research A 1999)
X-ray CCD calibration system using fluorescent lines .......... 621
K. Hamaguchi, Y. Maeda, H. Matsumoto, M. Nishiuchi,
H. Tomida, K. Koyama, H. Awaki, T.G. Tsuru (Nuclear
Instruments and Methods in Physics Research A 2000)
Particle tracking using CMOS monolithic active pixel sensor ... 626
G. Claus, C. Colledani, W. Dulinski, D. Husson,
R. Turchetta, J.L. Riester, G. Deptuch, G. Orazi,
M. Winter (Nuclear Instruments and Methods in Physics
Research A 2001)
Author Index .................................................. 631
Subject Index ................................................. 635
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