Gao W. Precision nanometrology: sensors and measuring systems for nanomanufacturing (London, 2010). - ОГЛАВЛЕНИЕ / CONTENTS
Навигация

Архив выставки новых поступлений | Отечественные поступления | Иностранные поступления | Сиглы
ОбложкаGao W. Precision nanometrology: sensors and measuring systems for nanomanufacturing. - London: Springer, 2010. - xiii, 354 p.: ill. (some col.). - Ind.: p.353-354. - (Springer series in advanced manufacturing). - Incl. bibl. ref. - Ind.: p.353-354. - ISBN 978-1-84996253-7
 

Оглавление / Contents
 
1  Angle Sensor for Measurement of Surface Slope and Tilt
   Motion ....................................................... 1
   1.1  Introduction ............................................ 1
   1.2  Angle Sensor with Quadrant Photodiode ................... 2
   1.3  Angle Sensor with Photodiode Array ..................... 15
   1.4  Angle Sensor with Single-cell Photodiode ............... 28
   1.5  Summary ................................................ 31
   1.6  References ............................................. 33
2  Laser Autocollimator for Measurement of Multi-axis Tilt
   Motion ...................................................... 35
   2.1  Introduction ........................................... 35
   2.2  Two-axis Laser Autocollimator .......................... 36
   2.3  One-lens Laser Micro-autocollimator .................... 53
   2.4  Three-axis Laser Autocollimator ........................ 56
   2.5  Summary ................................................ 67
   2.6  References ............................................. 67
3  Surface Encoder for Measurement of In-plane Motion .......... 69
   3.1  Introduction ........................................... 69
   3.2  Surface Encoder for MDOF In-plane Motion ............... 70
        3.2.1  Multi-probe-type MDOF Surface Encoder ........... 70
        3.2.2  Scanning Laser Beam-type MDOF Surface Encoder ... 83
   3.3  Fabrication of Two-axis Sinusoidal Grid for Surface
        Encoder ................................................ 90
        3.3.1  Fabrication System .............................. 90
        3.3.2  Analysis and Compensation of Fabrication
               Error ........................................... 91
   3.4  Application of Surface Encoder in Surface Motor-
        driven Planar Stage .................................... 99
        3.4.1  Stage System .................................... 99
        3.4.2  Stage Performance .............................. 104
   3.5  Summary ............................................... 107
   3.6  References ............................................ 107
4  Grating Encoder for Measurement of In-plane and
   Out-of-plane Motion ........................................ 109
   4.1  Introduction .......................................... 109
   4.2  Two-degree-of-freedom Linear Grating Encoder .......... 110
   4.3  Three-axis Grating Encoder with Sinusoidal Grid ....... 129
   4.4  Three-axis Grating Encoder with Rectangular XY-grid ... 136
   4.5  Summary ............................................... 140
   4.6  References ............................................ 140
5  Scanning Multi-probe System for Measurement of Roundness ... 143
   5.1  Introduction .......................................... 143
   5.2  Three-slope Sensor Method ............................. 144
   5.3  Mixed Method .......................................... 157
   5.4  Summary ............................................... 169
   5.5  References ............................................ 173
6  Scanning Error Separation System for Measurement of
   Straightness ............................................... 175
   6.1  Introduction .......................................... 175
   6.2  Three-displacement Sensor Method with Self Zero-
        adjustment ............................................ 175
        6.2.1  Three-displacement Sensor Method and Zero-
               adjustment Error ............................... 175
        6.2.2  Three-displacement Sensor Method with Self
               Zero-adjustment ................................ 180
   6.3  Error Separation Method for Machine Tool Slide ........ 195
        6.3.1  Slide Straightness Error of Precision Machine
               Tool ........................................... 195
        6.3.2  Error Separation Method for Slide
               Straightness Measurement ....................... 195
   6.4  Summary ............................................... 208
   6.5  References ............................................ 210
7  Scanning Micro-stylus System for Measurement of Micro-
   aspherics .................................................. 211
   7.1  Introduction .......................................... 211
   7.2  Compensation of Scanning Error Motion ................. 212
   7.3  Micro-stylus Probe .................................... 225
        7.3.1  Micro-ball Glass Tube Stylus ................... 225
        7.3.2  Tapping-type Micro-stylus ...................... 233
   7.4  Small-size Measuring Instrument for Micro-aspherics ... 237
   7.5  Summary ............................................... 242
   7.6  References ............................................ 242
8  Large Area Scanning Probe Microscope for Micro-textured
   Surfaces ................................................... 245
   8.1  Introduction .......................................... 245
   8.2  Capacitive Sensor-compensated Scanning Probe
        Microscope ............................................ 246
   8.3  Linear Encoder-compensated Scanning Probe
        Microscope ............................................ 258
   8.4  Spiral Scanning Probe Microscope ...................... 266
   8.5  Summary ............................................... 279
   8.6  References ............................................ 281
9  Automatic Alignment Scanning Probe Microscope System
   for Measurement of 3D Nanostructures ....................... 283
   9.1  Introduction .......................................... 283
   9.2  Optical Probe for Automatic Alignment ................. 285
        9.2.1  Alignment Principle ............................ 285
        9.2.2  Alignment Procedure ............................ 288
   9.3  Instrumentation of the Automatic Alignment AFM ........ 299
        9.3.1  Instrument Design .............................. 299
        9.3.2  Instrument Performance ......................... 305
   9.4  Summary ............................................... 317
   9.5  References ............................................ 318
10 Scanning Image-sensor System for Measurement of Micro-
   dimensions ................................................. 321
   10.1 Introduction .......................................... 321
   10.2 Micro-width Measurement by Scanning Area-image
        Sensor ................................................ 322
        10.2.1 Micro-width of Long Tool Slit .................. 322
        10.2.2 Evaluation of Slit Width ....................... 323
        10.2.3 Scanning Area-image Sensor ..................... 327
        10.2.4 Slit Width Measurement in Production Line ...... 331
   10.3 Micro-radius Measurement by Scanning Line-image
        Sensor ................................................ 335
        10.3.1 Micro-radius of Long Tool Edge ................. 335
        10.3.2 Evaluation of Edge Radius ...................... 336
        10.3.3 Edge Radius Measurement in Production Line ..... 341
   10.4 Summary ............................................... 350
   10.5 References ............................................ 351

Index ......................................................... 353


Архив выставки новых поступлений | Отечественные поступления | Иностранные поступления | Сиглы
 

[О библиотеке | Академгородок | Новости | Выставки | Ресурсы | Библиография | Партнеры | ИнфоЛоция | Поиск]
  © 1997–2024 Отделение ГПНТБ СО РАН  

Документ изменен: Wed Feb 27 14:22:36 2019. Размер: 11,142 bytes.
Посещение N 1618 c 20.09.2011