Scanning probe microscopy: electrical and electromechanical phenomena at the nanoscale: in 2 v. / ed. by Kalinin S., Gruverman A. - New York, NY: Springer Science + Business Media, LLC, 2007. - (Electrical and electromechanical phenomena at the nanoscale). - ISBN 0-387-28667-5  Место хранения:   091 | Филиал Института физики полупроводников CO РАН | Oмск

Оглавление / Contents

List of Contributors ........................................... ix About the Editors ............................................. xix VOLUME I Introduction: Scanning Probe Microscopy Techniques for Electrical and Electromechanical Characterization ............... 1 S.V. Kalinin and A. Gruverman Part I. SPM Techniques for Electrical Characterization .......... 9 I.1. Scanning Tunneling Potentiometry: The Power of STM applied to Electrical Transport ........................... 11 A.P. Baddorf I.2. Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopy .................. 31 P. Eyben. W. Vandervorst, D. Alvarez, M. Xu., and M. Fouchier I.3. Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics ........ 88 J.J. Kopanski I.4. Principles of Kelvin Probe Force Microscopy .............. 113 Th. Glatzel, M.Ch. Lux-Steiner, E. Strassburg, A. Boag, and Y. Rosenwaks I.5. Frequency-Dependent Transport Imaging by Scanning Probe Microscopy ......................................... 132 Ryan O'Havre, Minhwan Lee, Fritz B. Prinz, and Sergei V. Kalinin I.7. Principles of Near-Field Microwave Microscopy ............ 215 Steven M. Anlage, Vladimir V. Talanov, and Andrew R. Schwartz I.8. Electromagnetic Singularities and Resonances in Near-Field Optical Probes ................................ 254 Alexandre Bouhelier and Renaud Bachetot I.9. Electrochemical SPM: Fundamentals and Applications ....... 280 T.J. Smith and K.J. Stevenson I.10. Near-Field High-Frequencv Probing ....................... 315 C.A. Paulson and D.W. van der Weide Part II. Electrical and Electromechanical Imaging at the Limits of Resolution ................................. 347 II.1. Scanning Probe Microscopy on Low-Dimensional Electron Systems in III-V Semiconductors ......................... 349 Markus Morgenstern II.2. Spin-Polarized Scanning Tunneling Microscopy ............ 372 Wulf Wulfhekel, Uta Schlickum, and Jürgen Kirschner II.3. Scanning Probe Measurements of Electron Transport in Molecules ............................................... 395 Kevin F. Kelly and Paul S. Weiss II.4. Scanning Probe Microscopy of Individual Carbon Nunotube Quantum Devices ................................ 423 C. Staii, M. Radosavljevic, and A.T. Johnson II.5. Conductance AFM Measurements of Transport Through Nanotubes and Nanotuhe Networks ......................... 440 M. Stadermann and S. Washburn II.6. Theory of Scanning Probe Microscopy ..................... 455 Vincent Meunier and Philippe Lambin II.7. Multi-Probe Scanning Tunneling Microscopy ............... 480 Shuji Hasegawa II.8. Dynamic Force Microscopy and Spectroscopy in Vacuum ..... 506 Udo D. Schwarz and Hcndrik Hölscher II.9. Scanning Tunneling Microscopy and Spectroscopy of Manganites .............................................. 534 Christoph Renner and Henrik M. Rønnow VOLUME II Part III. Electrical SPM Characterization of Materials and Devices ............................................. 559 III.1. Scanning Voltage Microscopy: Investigating the Inner Workings of Optoelectronic Devices ..................... 561 Scott H. Kuntze, Dayan Ban, Edward H. Sargent, St. John Dixon-Warren, J. Kenton White, and Karin Hinzer III.2. Electrical Scanning Probe Microscopy of Biomolecules on Surfaces and at Interfaces .......................... 601 Ida Lee and Elias Greenbaum III.3. Electromechanical Behavior in Biological Systems at the Nanoscale .......................................... 615 A. Gruverman, B.J. Rodriguez, and S.V. Kalinin III.4. Scanning Capacitance Microscopy: Applications in Failure Analysis, Active Device Imaging, and Radiation Effects ...................................... 634 C.Y. Nakakura, P. Tangyunyong, and M.L. Anderson III.5. Kelvin Probe Force Microscopy of Semiconductors ........ 663 Y. Rosenwaks, S. Saraf, O. Tal, A. Schwarzman, Th. Glatzel, and M.Ch. Lux-Steiner III.6. Nanoscale Characterization of Electronic and Electrical Properties of III-Nitrides by Scanning Probe Microscopy ....................................... 690 B.J. Rodriguez, A. Gruverman, and R.J. Nemanich III.7. Electron Flow Through Molecular Structures ............. 715 Sidney R. Cohen III.8. Electrical Characterization of Perovskite Nanostructures by SPM .................................. 746 K. Szot, B. Reichenberg, F. Peter, R. Waser, and S. Tiedke III.9. SPM Measurements of Electric Properties of Organic Molecules .............................................. 776 Takao Ishida, Wataru Mizutani, Yasuhisa Naitoh, and Hiroshi Tokumoto III.10. High-Sensitivity Electric Force Microscopy of Organic Electronic Materials and Devices .............. 788 William R. Silveira, Erik M. Muller, Tse Nga Ng, David H. Dunlap, and John A. Marohn Part IV. Electrical Nanofabrication ........................... 831 IV.1. Electrical SPM-Based Nanofabrication Techniques ......... 833 Nicola Naujoks, Patrick Mesquida, and Andreas Stemmer IV.2. Fundamental Science anil Lithographic Applications of Scanning Prohe Oxidation ............................. 858 J.A. Dagata IV.3. UHV-STM Nanofabrication on Silicon ...................... 880 Peter M. Albrecht, Laura B. Ruppalt, and Joseph W. Lyding IV.4. Ferroelectric Lithography ............................... 906 Dongbo Li and Dawn A. Bonnell IV.5. Patterned Self-Assemhled Monolayers via Scanning Probe Lithography ....................................... 929 James A. Williams, Matthew S. Lewis, and Christopher B. Gorman IV.6. Resistive Probe Storage: Read/Write Mechanism ........... 943 Seungbum Hong and Noyeol Park Index